- direct scanning
- тлв прямой анализ изображения
English-Russian electronics dictionary .
direct scanning
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Scanning acoustic microscope — A Scanning Acoustic Microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called Scanning Acoustic Tomography). It is commonly used in failure analysis and non destructive evaluation. It also … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface … Wikipedia
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Scanning transmission electron microscopy — A scanning transmission electron microscope (STEM) is a type of transmission electron microscope. With it, the electrons pass through the specimen, but, as in scanning electron microscopy, the electron optics focus the beam into a narrow spot… … Wikipedia
Scanning Hall probe microscope — The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a… … Wikipedia
Direct laser writing — A way to structure photosensitive materials in three dimensions is called Direct Laser Writing (DLW). Let s assume you take a laser operating at a wavelength where the exposed photo resist would usually be completely transparent due to the non… … Wikipedia
Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… … Wikipedia
Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Confocal laser scanning microscopy — (CLSM or LSCM) is a technique for obtaining high resolution optical images with depth selectivity.[1] The key feature of confocal microscopy is its ability to acquire in focus images from selected depths, a process known as optical sectioning.… … Wikipedia
